TELECOMMUNICATIONS AND RADIO ENGINEERING - 2011 Vol. 70,
No 17 		 

 

 

 

APPLICATION OF THE SPECTRAL INTERFEROMETRY METHOD FOR MICRO- AND NANODISTANCE MEASUREMENT

K.A. Lukin1, Yu.P. Machekhin2, M.B. Danailow3 & D.N. Tatyanko1
1A. Usikov Institute of Radio Physics and Electronics,
National Academy of Sciences of Ukraine
12, Academician Proskura St., Kharkiv 61085, Ukraine
2Kharkiv National University of Radio Engineering and Electronics,
14, Lenin Ave, Kharkiv, 61166, Ukraine
3Laser Laboratory, Synchrotron, SS14, km.163.5, 34012, Trieste, Italy
Address all correspondence to K.A. Lukin E-mail: lukin.konstantin@ire.kharkov.ua

Abstract
The result of the investigations into the optical interferometry using the low-coherent radiation sources beyond the coherence zone are presented. It is shaven that when the difference in the Michelson interferometer arms exceeds the coherence length of a light-emitting diode (LED) radiation, the spectral interference phenomenon may well be utilized to make measurements of micro- and nanodistances depending upon the delay time and the relative phase between the reference and probing signals.
KEY WORDS: spectral interferometry, light-emitting diode, noise optical signal, Michelson interferometer

References

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pages 1579-1591

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