ELECTROMAGNETIC PROPERTIES OF RESONATOR MICROPROBE FOR THE SCANNING MICROWAVE MICROSCOPY
 
    
  
    Yu.E. Gordienko, S.U. Larkin, & A.M. Prokaza
 
Kharkov National University of Radio Engineering and Electronics, 
14, Lenin Ave, Kharkiv, 61166, Ukraine  
Address all correspondence to A.M. Prokaza E-mail: sfirate@mail.ru 
         Abstract 
          
This paper studies the electromagnetic properties of resonator probes with a coaxial measuring aperture that are widely used for the scanning microwave microscopy (SMM). The quantifications of localization sizes of the near-field and spatial distribution of its electric components as a function of aperture geometry and probe point shape have been established. The dependence of Q-factor and resonance frequency of the probes on aperture geometry, point shape and electric parameters of an object has been studied for the semiconductor and dielectric objects. It has been shown that the spherical shape of a probe point improves considerably the spatial resolution of probes and it does not lead to the substantial degradation of their sensitivity.  
        KEY WORDS:scanning microwave microscopy, resonator measuring transducer, probe, object, aperture, Q-factor, resonance frequency, field distribution, sensitivity, spatial resolution 
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