TELECOMMUNICATIONS AND RADIO ENGINEERING - 2010 Vol. 69,
No 11
 

 

 

 

Self-Excited Oscillations in Abrupt p-n Junctions with a Fixed Reverse Bias


K.A. Lukin & P.P. Maksymov
A. Usikov Institute of Radio Physics and Electronics,
National Academy of Sciences of Ukraine
12, Academician Proskura St., Kharkiv 61085, Ukraine
«Address all correspondence to K.A. Lukin E-mail: Lndes@kharkov.com

Abstract
Numerical methods are used to solve the drift-diffusion model equations for reverse-based p-n junctions. A regime of self-excited oscillations is analyzed for an abrupt p-n junction with a fixed reverse bias. As has been shown, the equations of the drift-diffusion model of the p-n junctions under analysis in fact make up a mathematical model of a self-oscillating system. The generation mechanism of self-excited excitations has been investigated. The factors influencing the oscillation frequency, amplitude and spectrum have been established and frequency ranges determined for reverse-biased p-n junctions made of various materials.

KEY WORDS:semiconductor, self-oscillation diffusive-drifting model, reverse-biased p-n junction, impact ionization

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pages 1005-1017

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